WFU Physics Colloquium

TITLE: Photocurrent And Noise Analysis as Alternative Approaches to Understanding OFET Behavior

SPEAKER: Professor John Kymissis ,

TIME: Wednesday October 6, 2010 at 4:00 PM

PLACE: Room 101 Olin Physical Laboratory

The characterization of organic field effect transistors is complicated by the influence of the contacts on channel behavior and the trap limited conduction mechanism which governs device performance.

In this presentation, several strategies for probing OFETs will be discussed. In particular, the use of spectrally resolved photocurrent spectroscopy will be demonstrated as a strategy for the analysis of trap states in the device, spatially resolved photocurrent will be presented as an approach for measuring internal device potential, and noise spectroscopy will be presented as an approach to evaluating the effect of trap states on channel conduction. These probes provide additional pathways for analyzing OFET device and material behavior with different complicating parasitics than incumbent characterization approaches.

The applications of OFETs, including their utility in instrumenting electroactive polymers, will also be discussed.