WFU Physics Colloquium

Title: "When Tiny Divided by Tiny Equals a Big Problem" - Radiation induced errors in memory.

Speaker:

Dr. Mark W. Roberson
Member of Technical Staff, Advanced Packaging and Interconnection Group, MCNC

Time:

4 PM, Thursday, September 18, 1997

Place:

Room 101, Olin Physical Laboratory

Abstract:

In the mid 1970's researchers began to document unusual failures in solid state devices. The newer generation, small (for the time) devices suffered very rare, random events in which the state of a logic element changed for no discernible reason. No physical damage was seen in the devices, and after the so-called "soft error", the device resumed normal operation. Subsequent study showed the problem to have arisen from extremely low levels of radiation which caused charge production in silicon. This talk will be a review of the mechanisms for soft errors and a description of ways in which the soft error rate (SER) can be reduced. Note: (The WFU Physics Department does not like to brag, but Dr. Roberson earned his BS degree and won the Spea's award at Wake Forest in 1986.)