Professor Harald Ade
Department of Physics
North Carolina State University
4 PM, Thursday, September 19, 1996
Room 101, Olin Physical Laboratory
We will discuss the present status of X-ray Microscopy and its applications to polymeric systems. High spatial resolution of presently 30-50 nm is achieved with the use of Fresnel zone plates, while chemical and orientational analytical capabilities are provided via Near Edge X-ray Absorpton Fine Structure (NEXAFS) spectroscopy. Polymer systems for which new information has been provided by x-ray microscopy include phase separated liquid crystaline polyesters, polymer blends, polyurethanes and Kevlar fibers. While almost all experiments to date have been performed in transmission, we will also present progress with a scanning X-ray Photoemission (XPS) Microscope that could be used to study surfaces of polymers and other materials.